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Full Product Line FISCHERSCOPE® X-RAY Fluorescence Measuring Systems (XRF)


XAN 500

    Handheld X-Ray fluorescence for Coating thickness and Material analysis FISCHERSCOPE XAN 500

XAN Gold

    Compact X-Ray fluorescence Model GOLDSCOPE Series for Gold and Precious Metals Analysis

PCB

    Specific FISCHERSCOPE XRF instruments for PCB and Wafer Testing

XUL

    Robust and inexpensive X-ray fluorescence (XRF) measuring instrument for non-destructive coating thickness measurement and material analysis

XULM

    X-ray fluorescence (XRF) measuring instrument for coating thickness measurements and analyses, even on small components

XAN_220

    X-ray fluorescence (XRF) measuring instrument for fast and non-destructive analysis of gold and silver alloys

XAN_250

    Universal high performance X-ray fluorescence (XRF) measuring instrument for fast and non-destructive material analysis and coating thickness measurement

XDL

    X-ray fluorescence (XRF) measuring instrument for manual or automated coating thickness measurements on functional coatings, corrosion protection coatings and mass-produced parts

XDLM

    X-ray fluorescence (XRF) measuring instrument for manual or automated coating thickness measurements and analyses on pc-boards, electronics components and mass-produced parts, even on small components

XDAL

    X-ray fluorescence (XRF) measuring instrument with a programmable X/Y-stage and Z-axis for automated measurements of coating thicknesses and for material analysis

XDAL-600

    The FISCHERSCOPE® X-RAY XDAL 600 is designed as a user-friendly XRF bench-top instrument for non-destructive coating thickness measurements and material analysis.

XDV_SDD

    High performance X-ray fluorescence (XRF) measuring system with a programmable XY-stage and Z-axis for automated measurements of very thin coatings and for trace analysis

XDV_µ

    X-ray fluorescence (XRF) measuring instrument with a polycapillary x-ray optics for automated measurements and analyses of coating thicknesses and compositions on very small components and structures

XUV_773

    High performance X-ray fluorescence (XRF) measuring instrument with vacuum chamber for non-destructive material analysis

X-RAY 4000

    X-ray fluorescence (XRF) measuring system for continuous in-line measurement and analysis in production processes, on flat and stamped strips, also with formed and stamped contact areas

X-RAY 5000

    X-ray fluorescence (XRF) measuring system for continuous in-line measurement and analysis of thin coatings, i.e. CIGS, CIS, and CdTe, in production processes

Software WinFTM

    Software for all FISCHERSCOPE® X-RAY fluorescence (XRF) measuring systems

Accessories XRF

    Accessories for FISCHERSCOPE® X-ray fluorescence (XRF) measuring systems

Calibration Standards XRF

    Calibration standards (reference material) for FISCHERSCOPE® X-RAY fluorescence XRF measuring systems